The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Dec. 04, 2018
Applicant:

Nissan Chemical Industries, Ltd., Tokyo, JP;

Inventors:

Makoto Nakajima, Toyama, JP;

Wataru Shibayama, Toyama, JP;

Satoshi Takeda, Toyama, JP;

Kenji Takase, Funabashi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/11 (2006.01); G03F 7/075 (2006.01); C08G 77/28 (2006.01); G03F 7/26 (2006.01); H01L 21/033 (2006.01); C09D 183/08 (2006.01); G03F 7/16 (2006.01); G03F 7/20 (2006.01); G03F 7/30 (2006.01); H01L 21/027 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
G03F 7/11 (2013.01); C08G 77/28 (2013.01); C09D 183/08 (2013.01); G03F 7/0751 (2013.01); G03F 7/0752 (2013.01); G03F 7/0757 (2013.01); G03F 7/16 (2013.01); G03F 7/20 (2013.01); G03F 7/26 (2013.01); G03F 7/30 (2013.01); H01L 21/0274 (2013.01); H01L 21/0332 (2013.01); H01L 21/31133 (2013.01); H01L 21/31144 (2013.01);
Abstract

The present invention provides a resist underlayer film-forming composition for lithography for forming a resist underlayer film that can be used as a hard mask with use of hydrolysis-condensation product of a hydrolyzable silane which also absorbs KrF laser. A resist underlayer film-forming composition for lithography comprising, as a silane, a hydrolyzable silane, a hydrolysis product thereof, or a hydrolysis-condensation product thereof, wherein the hydrolyzable silane includes a hydrolyzable silane of Formula (1):RRSi(R)  Formula (1)[where Ris an organic group of Formula (2): and is bonded to a silicon atom through a Si—C bond; Ris an alkoxy group, an acyloxy group, or a halogen group; a is an integer of 1; b is an integer of 0 to 2; and a+b is an integer of 1 to 3], and a ratio of sulfur atoms to silicon atoms is 7% by mole or more in the whole of the silane. A resist underlayer film obtained by applying the resist underlayer film-forming composition onto a semiconductor substrate and baking it.


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