The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Apr. 17, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Tsai-Jung Ho, Changhua County, TW;

Yu-Shih Wang, Tainan, TW;

Tze-Liang Lee, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/8234 (2006.01); H01L 21/467 (2006.01); H01L 21/321 (2006.01); H01L 21/02 (2006.01); H01L 21/311 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
H01L 21/82345 (2013.01); H01L 21/022 (2013.01); H01L 21/0217 (2013.01); H01L 21/0228 (2013.01); H01L 21/02126 (2013.01); H01L 21/02274 (2013.01); H01L 21/31111 (2013.01); H01L 21/3212 (2013.01); H01L 21/32133 (2013.01); H01L 21/467 (2013.01); H01L 21/823431 (2013.01); H01L 21/823437 (2013.01); H01L 29/6656 (2013.01); H01L 29/66545 (2013.01); H01L 29/66795 (2013.01);
Abstract

A method includes forming a dummy gate structure over a substrate; forming a plurality of gate spacers on opposite sidewalls of the dummy gate structure; forming an interlayer dielectric (ILD) layer surrounding the gate spacers; replacing the dummy gate structure with a metal gate structure; etching back the metal gate structure to form a gate trench between the gate spacers; depositing a first dielectric layer in the gate trench, in which the first dielectric layer has horizontal portions over the metal gate structure and the ILD layer, and vertical portions on sidewalls of the gate spacers; etching the vertical portions of the first dielectric layer until the sidewalls of the gate spacers exposed; and performing depositing the first dielectric layer and etching the vertical portions of the first dielectric layer in an alternate manner.


Find Patent Forward Citations

Loading…