The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Dec. 18, 2019
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Akihiro Yokota, Miyagi, JP;

Takanori Banse, Miyagi, JP;

Joji Takayoshi, Miyagi, JP;

Shinya Morikita, Miyagi, JP;

Naohiko Okunishi, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01J 37/32 (2006.01); H05H 1/46 (2006.01); H01L 21/02 (2006.01); H01L 21/3105 (2006.01); H01L 21/311 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32091 (2013.01); H01J 37/32183 (2013.01); H01J 37/32532 (2013.01); H01J 37/32669 (2013.01); H01L 21/0217 (2013.01); H01L 21/02164 (2013.01); H01L 21/311 (2013.01); H01L 21/31055 (2013.01); H01L 21/31116 (2013.01); H01L 21/768 (2013.01); H05H 1/46 (2013.01);
Abstract

A plasma processing method for a workpiece in a plasma processing apparatus includes (i) performing a first plasma processing on a workpiece, and (ii) performing a second plasma processing on the workpiece. Power of second radio frequency waves set in the second plasma processing is greater than the power of the second radio frequency waves set in the first plasma processing. In the second plasma processing, a magnetic field distribution having a horizontal component on an edge side of the workpiece greater than a horizontal component on a center of the workpiece is formed by an electromagnet.


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