The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Jan. 29, 2020
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Sheng-Hsiung Chen, Hsinchu, TW;

Jyun-Hao Chang, Hsinchu, TW;

Ting-Wei Chiang, New Taipei, TW;

Fong-Yuan Chang, Hsinchu, TW;

I-Lun Tseng, Hsinchu, TW;

Po-Hsiang Huang, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/394 (2020.01);
U.S. Cl.
CPC ...
G06F 30/394 (2020.01); G06F 30/3947 (2020.01); G06F 30/3953 (2020.01);
Abstract

A method of modifying a cell includes determining a number of pins in a maximum overlapped pin group region. The method further includes determining a number of routing tracks within a span region of the maximum overlapped pin group region. The method further includes comparing the number of pins and the number of routing tracks within the span region to determine a global tolerance of the cell. The method further includes increasing a length of at least one pin of the maximum overlapped pin group in response to the global tolerance failing to satisfy a predetermined threshold.


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