The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Jul. 31, 2019
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Patricius Aloysius Jacobus Tinnemans, Hapert, NL;

Patrick Warnaar, Tilburg, NL;

Vasco Tomas Tenner, Amsterdam, NL;

Maurits Van der Schaar, Eindhoven, NL;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/265 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2656 (2013.01);
Abstract

Disclosed is a method for obtaining a computationally determined interference electric field describing scattering of radiation by a pair of structures comprising a first structure and a second structure on a substrate. The method comprises determining a first electric field relating to first radiation scattered by the first structure; determining a second electric field relating to second radiation scattered by the second structure; and computationally determining the interference of the first electric field and second electric field, to obtain a computationally determined interference electric field.


Find Patent Forward Citations

Loading…