The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Jan. 25, 2017
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Shin Imamura, Tokyo, JP;

Takashi Ohshima, Tokyo, JP;

Tomonobu Tsuchiya, Tokyo, JP;

Hajime Kawano, Tokyo, JP;

Makoto Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); H01J 49/02 (2006.01); H01J 37/244 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
H01J 49/025 (2013.01); G01T 1/20 (2013.01); G01T 1/2018 (2013.01); G01T 1/24 (2013.01); H01J 37/244 (2013.01); H01J 2237/2443 (2013.01); H01J 2237/28 (2013.01);
Abstract

The objective of the present invention is to provide a charged particle detector and a charged particle beam device with which it is possible to acquire a high luminous output while rapidly eliminating charged particles that are incident to a scintillator. In order to achieve said objective the present invention proposes: a charged particle detector provided with a light-emitting unit including a laminated structure obtained by laminating a GaInN-containing layer and a GaN layer, and provided with a conductive layer that is in contact with the GaInN-containing layer on the charged particle incidence surface side of the laminated structure; and a charged particle beam device.


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