The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Apr. 20, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Wei-Yang Lee, Taipei, TW;

Tzu-Hsiang Hsu, Hsinchu County, TW;

Ting-Yeh Chen, Hsinchu, TW;

Feng-Cheng Yang, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); H01L 29/00 (2006.01); H01L 29/78 (2006.01); H01L 21/8238 (2006.01); H01L 21/84 (2006.01); H01L 27/11 (2006.01); H01L 29/08 (2006.01); H01L 29/16 (2006.01); H01L 29/161 (2006.01); H01L 29/165 (2006.01); H01L 29/66 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7848 (2013.01); H01L 21/823821 (2013.01); H01L 21/845 (2013.01); H01L 27/1104 (2013.01); H01L 27/1116 (2013.01); H01L 29/0847 (2013.01); H01L 29/161 (2013.01); H01L 29/165 (2013.01); H01L 29/1608 (2013.01); H01L 29/66636 (2013.01); H01L 29/66795 (2013.01); H01L 29/7851 (2013.01);
Abstract

A semiconductor structure includes a substrate, first fins extending from the substrate with a first fin pitch, and second fins extending from the substrate with a second fin pitch that is smaller than the first fin pitch. The semiconductor structure also includes first gate structures engaging the first fins, second gate structures engaging the second fins, first epitaxial semiconductor features adjacent the first gate structures, and second epitaxial semiconductor features adjacent the second gate structures. The first epitaxial semiconductor features are partially embedded in the first fins at a first depth, and the second epitaxial semiconductor features are partially embedded in the second fins at a second depth that is smaller than the first depth.


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