The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2021

Filed:

Mar. 14, 2018
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Feng Wei Kuo, Zhudong Township, TW;

Shuo-Mao Chen, New Taipei, TW;

Chin-Yuan Huang, Hsinchu, TW;

Kai-Yun Lin, Hsinchu, TW;

Ho-Hsiang Chen, Hsinchu, TW;

Chewn-Pu Jou, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); H01L 23/544 (2006.01); H01L 25/07 (2006.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); H01L 23/544 (2013.01); H01L 25/07 (2013.01); H01L 2223/54426 (2013.01);
Abstract

A method of verifying an integrated circuit stack includes adding a dummy layer to a contact pad of a functional circuit, wherein a location of the dummy layer is determined based on a location of a contact pad of a connecting substrate. The method further includes converting the dummy layer location to the connecting substrate. The method further includes determining whether the dummy layer is aligned with the contact pad of the connecting substrate. The method further includes adjusting the dummy layer location in the functional circuit when the dummy layer location is misaligned with the contact pad of the connecting substrate.


Find Patent Forward Citations

Loading…