The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Jan. 11, 2018
Applicant:

Globalfoundries U.s. Inc., Santa Clara, CA (US);

Inventors:

Robert Finlay, Ballston Lake, NY (US);

Erik Robert Hosler, Cohoes, NY (US);

Sheldon Meyers, Halfmoon, NY (US);

Scott Kenny, Ballston Lake, NY (US);

Assignee:

GLOBALFOUNDRIES U.S. INC., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/16 (2006.01); B05D 3/00 (2006.01); G03F 7/20 (2006.01); B05B 3/02 (2006.01); B05D 1/00 (2006.01); G03F 7/004 (2006.01); H01L 21/67 (2006.01); H01L 21/687 (2006.01); H01L 21/683 (2006.01);
U.S. Cl.
CPC ...
G03F 7/164 (2013.01); B05B 3/02 (2013.01); B05D 1/005 (2013.01); B05D 3/207 (2013.01); G03F 7/0047 (2013.01); G03F 7/162 (2013.01); G03F 7/2004 (2013.01); H01L 21/6715 (2013.01); H01L 21/6838 (2013.01); H01L 21/68757 (2013.01);
Abstract

An EUV photoresist composition includes paramagnetic particles that are adapted to block EUV radiation. The magnetic manipulation of the paramagnetic particles within a deposited layer of EUV photoresist can beneficially impact focus control and the achievable line width roughness during subsequent photolithographic processing. A spin-coating apparatus for dispensing the EUV photoresist composition onto a substrate includes a plurality of concentric electromagnets located beneath the substrate that influence the distribution of the paramagnetic particles in the photoresist layer.


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