The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2021

Filed:

Sep. 20, 2019
Applicants:

Nippon Steel Chemical & Material Co., Ltd., Tokyo, JP;

Nippon Micrometal Corporation, Saitama, JP;

Inventors:

Tetsuya Oyamada, Tokyo, JP;

Tomohiro Uno, Tokyo, JP;

Takashi Yamada, Saitama, JP;

Daizo Oda, Saitama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); C22C 9/00 (2006.01); H01L 23/49 (2006.01);
U.S. Cl.
CPC ...
H01L 24/45 (2013.01); C22C 9/00 (2013.01); H01L 23/49 (2013.01); H01L 2224/45105 (2013.01); H01L 2224/45109 (2013.01); H01L 2224/45139 (2013.01); H01L 2224/45144 (2013.01); H01L 2224/45147 (2013.01); H01L 2224/45155 (2013.01); H01L 2224/45164 (2013.01); H01L 2224/45169 (2013.01); H01L 2924/01015 (2013.01); H01L 2924/01032 (2013.01);
Abstract

It is an object to provide a Cu alloy bonding wire for a semiconductor device that can satisfy required performance in high-density LSI applications. In the Cu alloy bonding wire for a semiconductor device according to the present invention, each of abundance ratios of crystal orientations <100>, <110> and <111> having an angular difference of 15 degrees or less from a direction perpendicular to one plane including a wire center axis out of crystal orientations on a wire surface is 3% or more and less than 27% in average area percentage.


Find Patent Forward Citations

Loading…