The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

May. 08, 2020
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Hiranmay Biswas, Kolkata, IN;

Kuo-Nan Yang, Hsinchu, TW;

Chung-Hsing Wang, Hsinchu County, TW;

Meng-Xiang Lee, Yunlin County, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/394 (2020.01); H01L 23/528 (2006.01); H01L 27/02 (2006.01); H01L 27/118 (2006.01); G06F 111/04 (2020.01); G06F 111/20 (2020.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
G06F 30/394 (2020.01); H01L 23/528 (2013.01); H01L 27/0207 (2013.01); H01L 27/11807 (2013.01); G06F 2111/04 (2020.01); G06F 2111/20 (2020.01); G06F 2119/18 (2020.01); H01L 2027/11861 (2013.01); H01L 2027/11875 (2013.01); H01L 2027/11877 (2013.01);
Abstract

A method for forming an integrated device includes following operations. It is provided a first circuit having a first connecting path in a metal line layer, a second connecting path, and a third connecting path. The second connecting path is electrically connected to a first connecting portion of the first connecting path in the metal line layer. The third connecting path is electrically coupled to a second connecting portion of the first connecting path in the metal line layer. An electromigration (EM) data of the first connecting path is analyzed to determine if a third connecting portion in the metal line layer between the first connecting portion and the second connecting portion induces EM phenomenon. The first circuit is modified to generate a second circuit when the third connecting portion induces EM phenomenon. The integrated device is generated according to the second circuit.


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