The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Nov. 26, 2019
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kandabara Tapily, Mechanicville, NY (US);

Jeffrey Smith, Clifton Park, NY (US);

Nihar Mohanty, Clifton Park, NY (US);

Anton J. deVilliers, Clifton Park, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/775 (2006.01); H01L 21/8238 (2006.01); H01L 21/822 (2006.01); H01L 29/78 (2006.01); H01L 29/423 (2006.01); H01L 27/06 (2006.01); H01L 27/092 (2006.01); H01L 29/786 (2006.01); B82Y 10/00 (2011.01); H01L 29/06 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 29/165 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66795 (2013.01); B82Y 10/00 (2013.01); H01L 21/8221 (2013.01); H01L 21/823814 (2013.01); H01L 27/0688 (2013.01); H01L 27/092 (2013.01); H01L 29/0653 (2013.01); H01L 29/0673 (2013.01); H01L 29/0847 (2013.01); H01L 29/1054 (2013.01); H01L 29/42392 (2013.01); H01L 29/66439 (2013.01); H01L 29/66545 (2013.01); H01L 29/66575 (2013.01); H01L 29/775 (2013.01); H01L 29/785 (2013.01); H01L 29/7833 (2013.01); H01L 29/7848 (2013.01); H01L 29/78696 (2013.01); H01L 29/165 (2013.01); H01L 29/4958 (2013.01);
Abstract

A semiconductor device herein includes doped extension regions for silicon and silicon germanium nanowires. The nanowires can be selectively grown and recessed into a gate spacer. The semiconductor device can include a gate structure including the gate spacer; the nanowire or channel extending through the gate structure such that an end of the channel is recessed within a recess in said gate spacer; an extension region in contact with the end of the channel within the recess, the extension region being formed of an extension material having a different composition than a channel material of the channel such that a strain is provided in the channel; and a source-drain contact in contact with the extension region and adjacent to the gate structure.


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