The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Dec. 04, 2019
Global Unichip Corporation, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;
Tse-Wei Wu, Hsinchu, TW;
Yu-Hsun Su, Hsinchu, TW;
Chen-Yuan Kao, Hsinchu, TW;
Min-Hsiu Tsai, Hsinchu, TW;
GLOBAL UNICHIP CORPORATION, Hsinchu, TW;
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD, Hsinchu, TW;
Abstract
A method for increasing coverage of a scan test, executed by at least one processor, includes following operations: analyzing a first netlist file and a second netlist file to acquire a change of a circuit structure, in which the first netlist file corresponds to a first scan chain circuitry, and the second netlist file corresponds to a second scan circuitry wherein the second netlist file is generated by processing the first netlist file with executing an engineering change order (ECO); repairing the second scan chain circuitry according to at least one predetermined criterion; evaluating a candidate node of the repaired second scan chain circuitry, to connect a new flip flop circuit generated after executing the ECO to the candidate node; and storing the second netlist file being processed as a third netlist file, to fabricate an integrated circuit.