The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Sep. 19, 2018
Applicant:

United Microelectronics Corp., Hsinchu, TW;

Inventors:

Shih-Che Huang, Chiayi, TW;

Shih-Hsien Chen, Kaohsiung, TW;

Ching-Li Yang, Pingtung County, TW;

Chih-Sheng Chang, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/764 (2006.01); H01L 21/768 (2006.01); H01L 23/58 (2006.01); H01L 23/10 (2006.01); H01L 23/522 (2006.01); H01L 21/48 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 23/585 (2013.01); H01L 21/4846 (2013.01); H01L 21/7682 (2013.01); H01L 23/10 (2013.01); H01L 23/522 (2013.01); H01L 23/562 (2013.01); H01L 21/76807 (2013.01);
Abstract

A die seal ring and a manufacturing method thereof are provided. The die seal ring includes a substrate, a dielectric layer, and conductive layers. The dielectric layer is disposed on the substrate. The conductive layers are stacked on the substrate and located in the dielectric layer. Each of the conductive layers includes a first conductive portion and a second conductive portion. The second conductive portion is disposed on the first conductive portion. A width of the first conductive portion is smaller than a width of the second conductive portion. A first air gap is disposed between a sidewall of the first conductive portion and the dielectric layer. A second air gap is disposed between a sidewall of the second conductive portion and the dielectric layer. The die seal ring and the manufacturing method thereof can effectively prevent cracks generated during the die sawing process from damaging the circuit structure.


Find Patent Forward Citations

Loading…