The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Jun. 24, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Winnie Victoria Wei-Ning Chen, Zhubei, TW;

Meng-Hsuan Hsiao, Hsinchu, TW;

Tung-Ying Lee, Hsinchu, TW;

Pang-Yen Tsai, Jhu-bei, TW;

Yasutoshi Okuno, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/092 (2006.01); H01L 21/02 (2006.01); H01L 21/306 (2006.01); H01L 29/06 (2006.01); H01L 29/10 (2006.01); H01L 29/16 (2006.01); H01L 29/423 (2006.01); H01L 21/8238 (2006.01);
U.S. Cl.
CPC ...
H01L 27/092 (2013.01); H01L 21/02636 (2013.01); H01L 21/30625 (2013.01); H01L 21/823807 (2013.01); H01L 29/0673 (2013.01); H01L 29/0676 (2013.01); H01L 29/1033 (2013.01); H01L 29/16 (2013.01); H01L 29/42392 (2013.01);
Abstract

A method for forming a semiconductor device is provided. The method includes removing a first portion of a substrate to form a recess in the substrate. The method includes forming an epitaxy layer in the recess. The epitaxy layer and the substrate are made of different semiconductor materials. The method includes forming a stacked structure of a plurality of first semiconductor layers and a plurality of second semiconductor layers alternately stacked over the substrate and the epitaxy layer. The method includes removing a second portion of the stacked structure and a third portion of the epitaxy layer to form trenches passing through the stacked structure and extending into the epitaxy layer. The stacked structure is divided into a first fin element and a second fin element by the trenches, and the first fin element and the second fin element are over the substrate and the epitaxy layer respectively.


Find Patent Forward Citations

Loading…