The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Jun. 22, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Marko Radosavljevic, Portland, OR (US);

Han Wui Then, Portland, OR (US);

Sansaptak Dasgupta, Hillsboro, OR (US);

Peter G. Tolchinsky, Beaverton, OR (US);

Assignee:

INTEL Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8258 (2006.01); H01L 21/02 (2006.01); H01L 27/12 (2006.01); H01L 29/04 (2006.01); H01L 29/08 (2006.01); H01L 29/16 (2006.01); H01L 29/20 (2006.01); H01L 27/092 (2006.01); H01L 27/06 (2006.01); H01L 29/66 (2006.01); H01L 21/762 (2006.01); H01L 21/8238 (2006.01);
U.S. Cl.
CPC ...
H01L 21/8258 (2013.01); H01L 21/0254 (2013.01); H01L 21/02381 (2013.01); H01L 21/02532 (2013.01); H01L 21/02609 (2013.01); H01L 27/0605 (2013.01); H01L 27/092 (2013.01); H01L 27/1207 (2013.01); H01L 29/045 (2013.01); H01L 29/0847 (2013.01); H01L 29/16 (2013.01); H01L 29/2003 (2013.01); H01L 21/76254 (2013.01); H01L 21/823807 (2013.01); H01L 29/66522 (2013.01); H01L 29/66545 (2013.01); H01L 29/66568 (2013.01); H01L 29/66628 (2013.01);
Abstract

Techniques are disclosed for monolithic co-integration of silicon (Si)-based transistor devices and III-N semiconductor-based transistor devices over a commonly shared semiconductor substrate. In accordance with some embodiments, the disclosed techniques may be used to provide a silicon-on-insulator (SOI) or other semiconductor-on-insulator structure including: (1) a Si (111) surface available for formation of III-N-based n-channel devices; and (2) a Si (100) surface available for formation of Si-based p-channel devices, n-channel devices, or both. Further processing may be performed, in accordance with some embodiments, to provide n-channel and p-channel devices over the Si (111) and Si (100) surfaces, as desired. In accordance with some embodiments, the disclosed techniques may be used to provide co-integrated III-N-based n-type metal-oxide-semiconductor (NMOS) devices and Si-based p-type metal-oxide-semiconductor (PMOS), NMOS, or complementary MOS (CMOS) devices with different step heights or with a given degree of co-planarity, as desired for a given target application or end-use.


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