The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2020

Filed:

Sep. 12, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Chih-Yu Wang, Taichung, TW;

Tien-Wen Wang, Hsinchu, TW;

Hsin-Hui Chou, Hsinchu County, TW;

In-Tsang Lin, Kaohsiung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H04R 1/04 (2006.01); H04R 1/08 (2006.01); B24B 49/00 (2012.01); B24B 49/10 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67253 (2013.01); B24B 49/003 (2013.01); B24B 49/10 (2013.01); H01L 21/67288 (2013.01); H04R 1/04 (2013.01); H04R 1/08 (2013.01);
Abstract

In a method of operating an apparatus for manufacturing or analyzing semiconductor wafers, sound in a process chamber of the apparatus during an operation of the apparatus is detected. An electrical signal corresponding to the detected sound is acquired by a signal processor. The acquired electrical signal is processed by the signal processor. An event during the operation of the apparatus is detected based on the processed electrical signal. The operation of the apparatus is controlled according to the detected event.


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