The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Sep. 09, 2014
Applicant:

Senju Metal Industry Co., Ltd., Tokyo, JP;

Inventors:

Hiroyoshi Kawasaki, Tochigi, JP;

Takahiro Roppongi, Tochigi, JP;

Daisuke Soma, Tochigi, JP;

Isamu Sato, Saitama, JP;

Yuji Kawamata, Tochigi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 35/00 (2006.01); H01L 23/00 (2006.01); H01L 23/522 (2006.01); B22F 1/00 (2006.01); H01L 23/50 (2006.01); B23K 35/26 (2006.01); C22C 13/00 (2006.01); C25D 5/12 (2006.01); C22C 9/00 (2006.01); C25D 7/00 (2006.01); C25D 5/10 (2006.01); B23K 35/30 (2006.01); B23K 35/02 (2006.01); B23K 35/36 (2006.01); B32B 15/01 (2006.01); B32B 15/20 (2006.01); H01L 23/48 (2006.01); H05K 3/40 (2006.01); H01B 1/02 (2006.01); H01L 21/288 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 24/13 (2013.01); B22F 1/00 (2013.01); B23K 35/0227 (2013.01); B23K 35/26 (2013.01); B23K 35/262 (2013.01); B23K 35/30 (2013.01); B23K 35/302 (2013.01); B23K 35/3615 (2013.01); B32B 15/01 (2013.01); B32B 15/20 (2013.01); C22C 9/00 (2013.01); C22C 13/00 (2013.01); C25D 5/10 (2013.01); C25D 5/12 (2013.01); C25D 7/00 (2013.01); H01L 23/481 (2013.01); H01L 23/50 (2013.01); H01L 23/522 (2013.01); B32B 2255/06 (2013.01); B32B 2255/205 (2013.01); H01B 1/026 (2013.01); H01L 21/2885 (2013.01); H01L 21/76885 (2013.01); H01L 24/11 (2013.01); H01L 2224/11825 (2013.01); H01L 2224/13005 (2013.01); H01L 2224/1357 (2013.01); H01L 2224/1358 (2013.01); H01L 2224/1366 (2013.01); H01L 2224/1369 (2013.01); H01L 2224/13147 (2013.01); H01L 2224/13582 (2013.01); H01L 2224/13655 (2013.01); H01L 2224/13657 (2013.01); H01L 2924/0002 (2013.01); H01L 2924/0103 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/0109 (2013.01); H01L 2924/01015 (2013.01); H01L 2924/01016 (2013.01); H01L 2924/01026 (2013.01); H01L 2924/01027 (2013.01); H01L 2924/01028 (2013.01); H01L 2924/01033 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/01048 (2013.01); H01L 2924/01049 (2013.01); H01L 2924/01051 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/01082 (2013.01); H01L 2924/01083 (2013.01); H01L 2924/01092 (2013.01); H01L 2924/35 (2013.01); H05K 3/4015 (2013.01); H05K 2201/10242 (2013.01);
Abstract

Provided are a Cu column, a Cu core column, a solder joint, and a through-silicon via, which have the low Vickers hardness and the small arithmetic mean roughness. For the Cu column 1 according to the present invention, its purity is equal to or higher than 99.9% and equal to or lower than 99.995%, its arithmetic mean roughness is equal to or less than 0.3 μm, and its Vickers hardness is equal to or higher than 20 HV and equal to or less than 60 HV. Since the Cu column 1 is not melted at a melting temperature in the soldering and a definite stand-off height (a space between the substrates) can be maintained, it is preferably applied to the three dimensional mounting or the pitch narrowing mounting.


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