The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Dec. 30, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Andrew W. Yeoh, Portland, OR (US);

Ruth Brain, Portland, OR (US);

Michael L. Hattendorf, Portland, OR (US);

Christopher P. Auth, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 21/768 (2006.01); H01L 23/522 (2006.01); H01L 23/528 (2006.01); H01L 21/8234 (2006.01); H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 27/088 (2006.01); H01L 23/532 (2006.01); H01L 27/092 (2006.01); H01L 21/8238 (2006.01); H01L 29/165 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76829 (2013.01); H01L 21/76801 (2013.01); H01L 21/76814 (2013.01); H01L 21/76816 (2013.01); H01L 21/76834 (2013.01); H01L 21/76843 (2013.01); H01L 21/76846 (2013.01); H01L 21/76849 (2013.01); H01L 21/76877 (2013.01); H01L 21/76897 (2013.01); H01L 21/82345 (2013.01); H01L 21/823431 (2013.01); H01L 21/823475 (2013.01); H01L 21/823842 (2013.01); H01L 21/823878 (2013.01); H01L 23/528 (2013.01); H01L 23/5226 (2013.01); H01L 23/53209 (2013.01); H01L 27/0886 (2013.01); H01L 29/66545 (2013.01); H01L 29/785 (2013.01); H01L 29/7845 (2013.01); H01L 29/7846 (2013.01); H01L 29/7854 (2013.01); H01L 21/76883 (2013.01); H01L 21/76885 (2013.01); H01L 21/823807 (2013.01); H01L 21/823821 (2013.01); H01L 21/823871 (2013.01); H01L 23/53238 (2013.01); H01L 27/0924 (2013.01); H01L 29/165 (2013.01); H01L 29/665 (2013.01); H01L 29/7848 (2013.01);
Abstract

Embodiments of the disclosure are in the field of advanced integrated circuit structure fabrication and, in particular, 10 nanometer node and smaller integrated circuit structure fabrication and the resulting structures. In an example, an integrated circuit structure includes a plurality of conductive interconnect lines in and spaced apart by an inter-layer dielectric (ILD) layer above a substrate. Individual ones of the plurality of conductive interconnect lines have an upper surface below an upper surface of the ILD layer. An etch-stop layer is on and conformal with the ILD layer and the plurality of conductive interconnect lines, the etch-stop layer having a non-planar upper surface with an uppermost portion of the non-planar upper surface over the ILD layer and a lowermost portion of the non-planar upper surface over the plurality of conductive interconnect lines.


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