The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Mar. 18, 2019
Applicant:

Tokyo Electron Limited, Minato-ku, Tokyo, JP;

Inventors:

Hirokazu Aizawa, Albany, NY (US);

Kaoru Maekawa, Ablany, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/76 (2006.01); H01L 21/768 (2006.01); H01L 21/321 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76897 (2013.01); H01L 21/3212 (2013.01); H01L 21/7684 (2013.01); H01L 21/76843 (2013.01); H01L 21/76877 (2013.01);
Abstract

Embodiments of systems and methods for semiconductor back end of line (BEOL) interconnect using multiple materials in a fully self-aligned via (FSAV) process. In an embodiment, a method includes receiving a substrate with a patterned structure formed on a surface of the substrate. A method may also include depositing a first interconnect material in a first region of the patterned structure. Such methods may also include depositing a second interconnect material in a second region of the patterned structure, wherein the first interconnect material is different from the second interconnect material, and wherein the first region and the second region include a common layer of the patterned structures.


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