The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jun. 12, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Nicolas J. Loubet, Guilderland, NY (US);

Siva Kanakasabapathy, Pleasanton, CA (US);

Kangguo Cheng, Schenectady, NY (US);

Jingyun Zhang, Albany, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/423 (2006.01); H01L 21/311 (2006.01); H01L 21/28 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/42392 (2013.01); H01L 21/28158 (2013.01); H01L 21/31144 (2013.01); H01L 29/6653 (2013.01); H01L 29/66545 (2013.01);
Abstract

A method of forming a semiconductor device that includes providing a first stack of nanosheets having a first thickness and a second stack of nanosheets having a second thickness; and forming a oxide layer on the first and second stack of nanosheets. The oxide layer fills a space between said nanosheets in the first stack, and is conformally present on the nanosheets in the second stack. The method further includes forming a work function metal layer on the first and second stack of nanosheets. In some embodiments, the work function metal layer is present on only exterior surfaces of the first stack to provide a single gate structure and is conformally present about an entirety of the nanosheets in the second stack to provide a multiple gate structure.


Find Patent Forward Citations

Loading…