The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Dec. 20, 2017
Applicant:

Xcelsis Corporation, San Jose, CA (US);

Inventors:

Javier A. Delacruz, San Jose, CA (US);

Steven L. Teig, Menlo Park, CA (US);

David Edward Fisch, Pleasanton, CA (US);

William C. Plants, Campbell, CA (US);

Assignee:

Xcelsis Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/26 (2006.01); H01L 23/00 (2006.01); G06F 11/22 (2006.01); G06F 11/273 (2006.01); H01L 25/00 (2006.01); H01L 25/18 (2006.01); G06N 20/00 (2019.01); G06N 3/063 (2006.01);
U.S. Cl.
CPC ...
G06F 11/26 (2013.01); G06F 11/2236 (2013.01); G06F 11/273 (2013.01); H01L 24/32 (2013.01); H01L 24/83 (2013.01); H01L 24/94 (2013.01); G06N 3/063 (2013.01); G06N 20/00 (2019.01); H01L 25/18 (2013.01); H01L 25/50 (2013.01); H01L 2224/32145 (2013.01); H01L 2224/32146 (2013.01); H01L 2224/8312 (2013.01); H01L 2224/83895 (2013.01); H01L 2224/83896 (2013.01); H01L 2924/143 (2013.01); H01L 2924/1432 (2013.01); H01L 2924/1434 (2013.01); H01L 2924/14335 (2013.01);
Abstract

This disclosure pertains to hardware compute arrays (sometimes called systolic arrays) for applications such as artificial intelligence (AI), machine learning (ML), digital signal processing (DSP), graphics processing units (GPUs), and other computationally intensive applications. More particularly, it pertains to novel and advantageous architecture innovations for efficiently and inexpensively implementing such arrays using multiple integrated circuits. Hardware and methods are disclosed to allow compute arrays to be tested after face-to-face or wafer-to-wafer bonding and without out any pre-bonding test. Defects discovered in the post-bonding testing can be completely or partially healed increasing yields and reducing costs.


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