The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Sep. 08, 2016
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Hirotaka Matsunaga, Okegawa, JP;

Kazunari Maki, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21C 37/00 (2006.01); C22C 9/00 (2006.01); H01B 1/02 (2006.01); H01B 5/02 (2006.01); B32B 15/01 (2006.01); B32B 15/20 (2006.01); H01R 4/58 (2006.01); C22F 1/08 (2006.01);
U.S. Cl.
CPC ...
C22C 9/00 (2013.01); B32B 15/018 (2013.01); B32B 15/20 (2013.01); H01B 1/02 (2013.01); H01B 1/026 (2013.01); H01B 5/02 (2013.01); H01R 4/58 (2013.01); C22F 1/08 (2013.01); Y10T 428/12431 (2015.01); Y10T 428/12903 (2015.01);
Abstract

A copper alloy for an electronic and electric device is provided. The copper alloy includes: Mg in a range of 0.15 mass % or more and less than 0.35 mass %; and a Cu balance including inevitable impurities, wherein the electrical conductivity of the copper alloy is more than 75% IACS, and a strength ratio TS/TS, which is calculated from strength TSobtained in a tensile test performed in a direction perpendicular to a rolling direction and strength TSobtained in a tensile test performed in a direction parallel to a rolling direction, is more than 0.9 and less than 1.1. The copper alloy may further include P in a range of 0.0005 mass % or more and less than 0.01 mass %.


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