The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Dec. 18, 2015
Applicant:

Tokyo Electron Limited, Minato-ku, JP;

Inventors:

Keisuke Yoshida, Koshi, JP;

Yuzo Ohishi, Koshi, JP;

Keisuke Sasaki, Koshi, JP;

Shoichi Terada, Koshi, JP;

Assignee:

TOKYO ELECTRON LIMITED, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70083 (2013.01); G03F 7/2008 (2013.01); G03F 7/70141 (2013.01); G03F 7/70191 (2013.01); H01L 21/67115 (2013.01); H01L 21/67248 (2013.01); G03F 7/7015 (2013.01); G03F 7/70433 (2013.01); G03F 2007/2067 (2013.01);
Abstract

A substrate processing apparatus includes a hot plate which supports and heats a substrate, a light source which emits etching energy beam such that the etching energy beam etches the substrate held by the hot plate, a window device which is positioned between the light source and the hot plate and transmits the etching energy beam emitted by the light source toward the substrate, and an adjusting device which adjusts emission amounts of the etching energy beam from portions of the window device toward the substrate such that the adjusting device reduces difference in etching amounts of portions of the substrate.


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