The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Dec. 03, 2018
Applicant:

Carl Zeiss Smt Gmbh, Oberkoch, DE;

Inventors:

Sascha Bleidistel, Aalen, DE;

Toralf Gruner, Aalen-Hofen, DE;

Christoph Zaczek, Heubach, DE;

Ralf Mueller, Aalen, DE;

Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G02B 13/14 (2006.01); G02B 17/08 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70258 (2013.01); G02B 13/143 (2013.01); G02B 17/0856 (2013.01); G02B 17/0892 (2013.01); G03F 7/706 (2013.01); G03F 7/70225 (2013.01);
Abstract

A catadioptric projection objective for images an object field onto an image field via imaging radiation. The projection objective includes at least one reflective optical component and a measuring device. The reflective optical component, during the operation of the projection objective, reflects a first part of the imaging radiation and transmits a second part of the imaging radiation. The reflected, first part of the imaging radiation at least partly contributes to the imaging of the object field. The transmitted, second part of the imaging radiation is at least partly fed to a measuring device. This allows a simultaneous exposure of the photosensitive layer at the location of the image field with the imaging radiation and monitoring of the imaging radiation with the aid of the measuring device.


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