The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Oct. 03, 2018
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventors:

Marco A. Zuniga, Berkely, CA (US);

Adam Brand, Palo Alto, CA (US);

Tom K. Castro, Santa Clara, CA (US);

Rajwinder Singh, Pleasanton, CA (US);

Badredin Fatemizadeh, Palo Alto, CA (US);

Assignee:

MAXIM INTEGRATED PRODUCTS, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 21/266 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7825 (2013.01); H01L 21/266 (2013.01); H01L 29/66704 (2013.01); H01L 29/7831 (2013.01);
Abstract

A dual-gate, self-aligned lateral double-diffused metal-oxide-semiconductor (LDMOS) transistor includes a silicon semiconductor structure, a lateral gate including a first dielectric layer and a first conductive layer stacked on the silicon semiconductor structure in a thickness direction, and a vertical gate. The vertical gate includes a second dielectric layer and a second conductive layer disposed in a trench of the silicon semiconductor structure, the second dielectric layer defining an edge of the lateral gate in a lateral direction. A method for forming a dual-gate, self-aligned LDMOS transistor includes (a) forming a vertical gate of the LDMOS transistor in a trench of a silicon semiconductor structure and (b) defining a lateral edge of a lateral gate of the LDMOS transistor using the vertical gate.


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