The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Apr. 26, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Christopher Boguslaw Kocon, Mountain Top, PA (US);

Hideaki Kawahara, Plano, TX (US);

Simon John Molloy, Allentown, PA (US);

Satoshi Suzuki, Ushiku Ibaraki, JP;

John Manning Savidge Neilson, Norristown, PA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 29/40 (2006.01); H01L 29/423 (2006.01); H01L 29/06 (2006.01); H01L 29/08 (2006.01); H01L 21/311 (2006.01); H01L 29/10 (2006.01); H01L 29/417 (2006.01); H01L 29/45 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7833 (2013.01); H01L 21/31105 (2013.01); H01L 29/063 (2013.01); H01L 29/0634 (2013.01); H01L 29/0696 (2013.01); H01L 29/086 (2013.01); H01L 29/0865 (2013.01); H01L 29/0878 (2013.01); H01L 29/0882 (2013.01); H01L 29/1087 (2013.01); H01L 29/1095 (2013.01); H01L 29/407 (2013.01); H01L 29/41766 (2013.01); H01L 29/42372 (2013.01); H01L 29/42376 (2013.01); H01L 29/66181 (2013.01); H01L 29/66712 (2013.01); H01L 29/66719 (2013.01); H01L 29/66727 (2013.01); H01L 29/7802 (2013.01); H01L 29/7803 (2013.01); H01L 29/7811 (2013.01); H01L 29/7827 (2013.01); H01L 29/7831 (2013.01); H01L 29/78642 (2013.01); H01L 29/402 (2013.01); H01L 29/4238 (2013.01); H01L 29/456 (2013.01);
Abstract

A semiconductor device includes a medium voltage MOSFET having a vertical drain drift region between RESURF trenches containing field plates which are electrically coupled to a source electrode of the MOSFET. A split gate with a central opening is disposed above the drain drift region between the RESURF trenches. A two-level LDD region is disposed below the central opening in the split gate. A contact metal stack makes contact with a source region at lateral sides of the triple contact structure, and with a body contact region and the field plates in the RESURF trenches at a bottom surface of the triple contact structure. A perimeter RESURF trench surrounds the MOSFET. A field plate in the perimeter RESURF trench is electrically coupled to the source electrode of the MOSFET. An integrated snubber may be formed in trenches formed concurrently with the RESURF trenches.


Find Patent Forward Citations

Loading…