Method of optimizing write voltage based on error buffer occupancy

Abstract

A method of writing data into a memory device is disclosed. The method comprises utilizing a pipeline to process write operations of a first plurality of data words addressed to a memory bank. The method further comprises writing a second plurality of data words into an error buffer associated with the memory bank wherein each data word of the second plurality of data words is either awaiting write verification associated with the memory bank or is to be re-written into the memory bank. Additionally, the method comprises monitoring an occupancy level of the error buffer and determining if the occupancy level of the error buffer has increased beyond a predetermined threshold. Subsequently, responsive to a determination that the occupancy level of the error buffer has increased beyond the predetermined threshold, increasing a write voltage of the memory bank, wherein subsequent write operations are performed at a higher write voltage.