The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2019

Filed:

Jan. 06, 2017
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Thomas A. Langdo, Cambridge, MA (US);

Matthew T. Currie, Brookline, MA (US);

Richard Hammond, Staffordshire, GB;

Anthony J. Lochtefeld, Ipswich, MA (US);

Eugene A. Fitzgerald, Windham, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/762 (2006.01); H01L 21/02 (2006.01); H01L 21/84 (2006.01); H01L 27/12 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76254 (2013.01); H01L 21/0245 (2013.01); H01L 21/0251 (2013.01); H01L 21/02532 (2013.01); H01L 21/76259 (2013.01); H01L 21/76264 (2013.01); H01L 21/84 (2013.01); H01L 27/1203 (2013.01); H01L 29/66772 (2013.01); H01L 29/66916 (2013.01); H01L 29/7842 (2013.01); H01L 29/78603 (2013.01); H01L 29/78684 (2013.01); H01L 29/78687 (2013.01); H01L 21/02381 (2013.01); H01L 21/02502 (2013.01); H01L 21/02505 (2013.01); H01L 21/02521 (2013.01); H01L 21/76275 (2013.01);
Abstract

The benefits of strained semiconductors are combined with silicon-on-insulator approaches to substrate and device fabrication.


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