The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Jan. 26, 2018
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Yan-Ming Tsai, Miaoli County, TW;

Wei-Yip Loh, Hsinchu, TW;

Yu-Ming Huang, Tainan, TW;

Hung-Hsu Chen, Tainan, TW;

Chih-Wei Chang, Hsin-Chu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/285 (2006.01); H01L 23/535 (2006.01); H01L 29/165 (2006.01); H01L 29/78 (2006.01); H01L 29/45 (2006.01); H01L 29/08 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76889 (2013.01); H01L 21/28518 (2013.01); H01L 21/76895 (2013.01); H01L 23/535 (2013.01); H01L 29/0847 (2013.01); H01L 29/165 (2013.01); H01L 29/45 (2013.01); H01L 29/665 (2013.01); H01L 29/6656 (2013.01); H01L 29/7848 (2013.01);
Abstract

A method for manufacturing a semiconductor includes following steps. An epitaxial structure including a first semiconductor material and a second semiconductor material is provided. A lattice constant of the second semiconductor material is greater than a lattice constant of the first semiconductor material. A metal-containing layer is deposited on the epitaxial structure. The metal containing layer includes a first metal material and a second metal material. An atomic size of the second metal material is greater than an atomic size of the first metal material. The metal-containing layer and the epitaxial structure are annealed to form a metal silicide layer on the epitaxial structure. The metal silicide layer includes the first semiconductor material, the second semiconductor material, the first metal material, and the second metal material.


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