The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Sep. 15, 2016
Applicant:

Entegris, Inc., Billerica, MA (US);

Inventors:

Patrick Doering, Holliston, MA (US);

Rajesh Tiwari, Chelmsford, MA (US);

Andrew Galpin, Westford, MA (US);

Assignee:

ENTEGRIS, INC., Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 37/04 (2012.01); B24B 53/017 (2012.01); B24B 53/12 (2006.01); B24D 7/04 (2006.01); B24B 37/20 (2012.01); B24B 37/34 (2012.01); B24D 7/08 (2006.01);
U.S. Cl.
CPC ...
B24B 53/017 (2013.01); B24B 37/04 (2013.01); B24B 37/20 (2013.01); B24B 37/34 (2013.01); B24B 53/12 (2013.01); B24D 7/04 (2013.01); B24D 7/08 (2013.01);
Abstract

A chemical mechanical planarization (CMP) pad conditioning assembly that includes one or more support structures positioned between one or more abrasive regions of the pad conditioning assembly is disclosed. The support structures and abrasive regions can be separated by one or more channels. A top surface of the one or more support structures is not co-planar with the top surface of the abrasive regions of the pad conditioning assembly, and the height of the top surface of the one or more support structures when measured to the pad facing surface of the pad conditioning assembly backing plate is less than the height of the top surfaces of the abrasive regions when measured to the pad facing surface of the pad conditioning assembly.


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