The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Jul. 16, 2018
Applicant:
Asml Netherlands B.v., Veldhoven, NL;
Inventors:
Duan-Fu Stephen Hsu, Fremont, CA (US);
Rafael C. Howell, Santa Clara, CA (US);
Xiaofeng Liu, Campbell, CA (US);
Assignee:
ASML Netherlands B.V., Veldhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 1/36 (2012.01); G03F 1/70 (2012.01);
U.S. Cl.
CPC ...
G03F 7/70641 (2013.01); G03F 1/36 (2013.01); G03F 1/70 (2013.01); G03F 7/705 (2013.01); G03F 7/70125 (2013.01); G03F 7/70191 (2013.01); G03F 7/70433 (2013.01); G03F 7/70441 (2013.01); G03F 7/70558 (2013.01);
Abstract
A method to improve a lithographic process for imaging a portion of a design layout onto a substrate using a lithographic projection apparatus having an illumination system and projection optics, the method including: obtaining an illumination source shape and a mask defocus value; optimizing a dose of the lithographic process; and optimizing the portion of the design layout for each of a plurality of slit positions of the illumination source.