The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Mar. 28, 2017
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Hao-Ming Chang, Pingtung, TW;

Chih-Ming Chen, Taoyuan County, TW;

Cheng-Ming Lin, Yunlin County, TW;

Sheng-Chang Hsu, New Taipei, TW;

Shao-Chi Wei, Hsinchu, TW;

Hsao Shih, Hsinchu, TW;

Li-Chih Lu, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01); G03F 1/26 (2012.01); H01L 21/027 (2006.01); G03F 1/38 (2012.01);
U.S. Cl.
CPC ...
G03F 1/26 (2013.01); G03F 1/38 (2013.01); H01L 21/0274 (2013.01);
Abstract

A method of fabricating a photomask includes providing a mask blank; removing a portion of the resist layer to form a patterned resist layer exposing a portion of the cooling layer; patterning the cooling layer by using the patterned resist layer as an etching mask; patterning the opaque layer; and removing the patterned resist layer and the patterned cooling layer. The mask blank includes a light-transmitting substrate and an opaque layer, a cooling layer, and a resist layer sequentially stacked thereon, wherein the cooling layer has a thermal conductivity ranging between 160 and 5000 and an effective atomic number ranging between 5 and 14.


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