The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Jul. 03, 2017
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Tzu-Ching Lin, Hsinchu, TW;

Chien-I Kuo, Chiayi County, TW;

Wei Te Chiang, Hsinchu, TW;

Wei Hao Lu, Hsinchu, TW;

Li-Li Su, ChuBei, TW;

Chii-Horng Li, Zhubei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 29/08 (2006.01); H01L 29/26 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 21/461 (2006.01); H01L 29/167 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66795 (2013.01); H01L 21/461 (2013.01); H01L 29/0653 (2013.01); H01L 29/0847 (2013.01); H01L 29/167 (2013.01); H01L 29/26 (2013.01); H01L 29/785 (2013.01); H01L 29/7848 (2013.01);
Abstract

An embodiment is a method including forming a raised portion of a substrate, forming fins on the raised portion of the substrate, forming an isolation region surrounding the fins, a first portion of the isolation region being on a top surface of the raised portion of the substrate between adjacent fins, forming a gate structure over the fins, and forming source/drain regions on opposing sides of the gate structure, wherein forming the source/drain regions includes epitaxially growing a first epitaxial layer on the fin adjacent the gate structure, etching back the first epitaxial layer, epitaxially growing a second epitaxial layer on the etched first epitaxial layer, and etching back the second epitaxial layer, the etched second epitaxial layer having a non-faceted top surface, the etched first epitaxial layer and the etched second epitaxial layer forming source/drain regions.


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