The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Jan. 04, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Weng Hong Teh, Phoenix, AZ (US);

Chia-Pin Chiu, Tempe, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/34 (2006.01); H01L 23/00 (2006.01); H01L 23/538 (2006.01); H01L 23/31 (2006.01); H01L 25/16 (2006.01); H01L 23/50 (2006.01); H01L 25/18 (2006.01); H01L 21/56 (2006.01);
U.S. Cl.
CPC ...
H01L 24/25 (2013.01); H01L 23/3107 (2013.01); H01L 23/3114 (2013.01); H01L 23/50 (2013.01); H01L 23/5389 (2013.01); H01L 24/19 (2013.01); H01L 24/24 (2013.01); H01L 25/16 (2013.01); H01L 25/18 (2013.01); H01L 21/568 (2013.01); H01L 23/3128 (2013.01); H01L 2224/04105 (2013.01); H01L 2224/12105 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/2501 (2013.01); H01L 2224/255 (2013.01); H01L 2224/2505 (2013.01); H01L 2224/2512 (2013.01); H01L 2224/73209 (2013.01); H01L 2224/81005 (2013.01); H01L 2224/92133 (2013.01); H01L 2924/10253 (2013.01); H01L 2924/12042 (2013.01); H01L 2924/141 (2013.01); H01L 2924/1431 (2013.01); H01L 2924/1461 (2013.01); H01L 2924/15151 (2013.01); H01L 2924/15192 (2013.01); H01L 2924/15747 (2013.01); H01L 2924/18161 (2013.01); H01L 2924/18162 (2013.01);
Abstract

Discussed generally herein are devices that include high density interconnects between dice and techniques for making and using those devices. In one or more embodiments a device can include a bumpless buildup layer (BBUL) substrate including a first die at least partially embedded in the BBUL substrate, the first die including a first plurality of high density interconnect pads. A second die can be at least partially embedded in the BBUL substrate, the second die including a second plurality of high density interconnect pads. A high density interconnect element can be embedded in the BBUL substrate, the high density interconnect element including a third plurality of high density interconnect pads electrically coupled to the first and second plurality of high density interconnect pads.


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