The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Aug. 01, 2016
Applicant:

Carl Zeiss Smt Gmbh, Oberkochen, DE;

Inventors:

Hartmut Enkisch, Aalen, DE;

Peter Huber, Heidenheim, DE;

Sebastian Strobel, Aalen, DE;

Assignee:

CARL ZEISS SMT GMBH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/10 (2006.01); G03F 7/20 (2006.01); G02B 5/08 (2006.01); G02B 5/09 (2006.01); G21K 1/06 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G03F 7/702 (2013.01); G02B 5/0816 (2013.01); G02B 5/0891 (2013.01); G02B 5/09 (2013.01); G02B 5/10 (2013.01); G02B 26/0833 (2013.01); G21K 1/062 (2013.01); G21K 2201/064 (2013.01);
Abstract

A method for producing a mirror element, in particular for a microlithographic projection exposure apparatus includes: providing a substrate (); and forming a layer stack () on the substrate, wherein the layer stack is formed so that a setpoint curvature of the mirror element for a predetermined operating temperature is generated by a bending force exerted by the layer stack, wherein the substrate has a curvature deviating from the setpoint curvature of the mirror element prior to the formation of the layer stack, and wherein the bending force exerted by the layer stack is at least partly generated by virtue of a post-treatment for changing the layer tension of the layer stack.


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