The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2019

Filed:

Nov. 22, 2017
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Kenny Linh Doan, Santa Clara, CA (US);

Usama Dadu, Santa Clara, CA (US);

Wonseok Lee, Santa Clara, CA (US);

Daisuke Shimizu, Santa Clara, CA (US);

Li Ling, Santa Clara, CA (US);

Kevin Choi, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01J 37/32 (2006.01); H02N 13/00 (2006.01); H01L 21/683 (2006.01); B08B 5/00 (2006.01); B08B 7/00 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32862 (2013.01); B08B 5/00 (2013.01); B08B 7/0071 (2013.01); H01J 37/32146 (2013.01); H01J 37/32816 (2013.01); H01L 21/6831 (2013.01); H02N 13/00 (2013.01); H01J 37/32724 (2013.01); H01L 21/67069 (2013.01);
Abstract

Embodiments include a plasma processing method for cleaning polymer byproducts from interior surfaces of the plasma chamber. In an embodiment the plasma process may include processing a workpiece in a plasma processing chamber. Thereafter, the method may include removing the workpiece from the processing chamber. After the workpiece is removed, embodiments may include cleaning the plasma processing chamber with a cleaning process that includes a high pressure cleaning process, a first low pressure cleaning process, and a second low pressure cleaning process, wherein the second low pressure cleaning process includes applying a pulsed bias.


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