The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Dec. 20, 2017
Applicant:

Nuflare Technology, Inc., Kanagawa, JP;

Inventors:

Hideshi Takahashi, Yokohama, JP;

Kiyotaka Miyano, Tokyo, JP;

Masayuki Tsukui, Yokohama, JP;

Hajime Nago, Yokohama, JP;

Yasushi Iyechika, Matsudo, JP;

Assignee:

NuFlare Technology, Inc., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/32 (2006.01); H01L 21/02 (2006.01); C23C 16/455 (2006.01); C23C 16/458 (2006.01); C23C 16/46 (2006.01); G03F 1/62 (2012.01);
U.S. Cl.
CPC ...
C23C 16/325 (2013.01); C23C 16/4584 (2013.01); C23C 16/45504 (2013.01); C23C 16/46 (2013.01); G03F 1/62 (2013.01); H01L 21/02167 (2013.01); H01L 21/02271 (2013.01); C23C 16/45565 (2013.01); H01L 21/02381 (2013.01); H01L 21/02447 (2013.01); H01L 21/02458 (2013.01);
Abstract

A vapor phase growth method according to an embodiment is a vapor phase growth method of forming on a single substrate a film having a composition different from a composition of the substrate. The method includes, rotating the single substrate with a center of the single substrate being a rotation center, heating a single substrate to a first temperature, and forming a silicon carbide film having a film thickness of 10 nm or more and 200 nm or less on a surface of the single substrate by supplying a first process gas containing silicon and carbon as a laminar flow in a direction substantially perpendicular to the surface of the single substrate.


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