The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Jul. 20, 2018
Applicant:

Winbond Electronics Corp., Taichung, TW;

Inventors:

Tsung-Huan Tsai, Taichung, TW;

Lih-Wei Lin, Taichung, TW;

I-Hsien Tseng, Taichung, TW;

Wen-Ting Wang, Taichung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 13/00 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 13/0069 (2013.01); G11C 13/0011 (2013.01); G11C 13/0097 (2013.01); G11C 29/44 (2013.01); G11C 2013/009 (2013.01);
Abstract

The disclosure provides a method for obtaining optimal operating condition of a resistive random access memory (RRAM). The method includes: retrieving an RRAM chip and performing a forming operation and an initial reset operation thereto based on a first operating condition; segmenting the RRAM chip into blocks; performing a set operation to each of the blocks based on various operating voltages; obtaining a fail bit value of each of the blocks; generating an operating characteristic curve related to the RRAM chip based on the fail bit value of each of the blocks and the operating voltages, wherein the operating characteristic curve has a lowest fail bit value and an operating voltage window; and when the lowest fail bit value and the operating voltage window satisfy a first condition and a second condition, respectively, determining the first operating condition is an optimal operating condition of the RRAM chip.


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