logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10325906 B1

PDFFull Text
Date of Patent:
Jun. 18, 2019

Filed:

Sep. 23, 2016

Esd testing structure, method of using same and method of forming same

Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Tzu-Heng Chang, New Taipei, TW;

Jen-Chou Tseng, Jhudong Township, TW;

Ming-Hsiang Song, Shin-Chu, TW;

Assignee:

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsinchu, TW;

Attorney:

Hauptman Ham, LLP

Primary Examiner:

Tung X Nguyen

Assistant Examiner:

Dominic E Hawkins

Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 27/02 (2006.01); H01L 23/62 (2006.01); H01L 21/66 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0288 (2013.01); G01R 31/002 (2013.01); G01R 31/2856 (2013.01); H01L 22/14 (2013.01); H01L 22/30 (2013.01); H01L 23/62 (2013.01);
Abstract

An electrostatic discharge (ESD) testing structure includes a measurement device in a first die. The ESD testing structure further includes a fuse in a second die. The ESD testing structure further includes a plurality of bonds electrically connecting the first die to the second die, wherein a first bond of the plurality of bonds electrically connects the fuse to the measurement device.

Find Patent Forward Citations

Chang, Tzu-Heng. (2019). Esd testing structure, method of using same and method of forming same (U.S. Patent No. 10325906). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10325906

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…