The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Jan. 24, 2018
Applicant:

Disco Corporation, Tokyo, JP;

Inventors:

Karl Heinz Priewasser, Munich, DE;

Hitoshi Hoshino, Munich, DE;

Assignee:

DISCO Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/78 (2006.01); H01L 21/683 (2006.01);
U.S. Cl.
CPC ...
H01L 21/78 (2013.01); H01L 21/6836 (2013.01); H01L 2221/68336 (2013.01);
Abstract

A method of processing a wafer having a plurality of devices partitioned by division lines, including attaching the wafer to an adhesive tape supported by a first annular frame, dividing the wafer along the division lines into a plurality of dies, and placing the wafer (and the adhesive tape) on a support surface of a support member before or after dividing the wafer, wherein an outer diameter of the support member in the plane of the support surface is smaller than an inner diameter of the first annular frame. The method also includes moving the first annular frame and at least a peripheral part of the support member relative to each other to radially expand the adhesive tape, thereby moving the dies away from each other, and attaching a second annular frame to a portion of the expanded adhesive tape arranged at the peripheral part of the support member.


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