The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Mar. 24, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Thomas J. Haigh, Jr., Claverack, NY (US);

Son V. Nguyen, Schenectady, NY (US);

Deepika Priyadarshini, Guilderland, NY (US);

Hosadurga Shobha, Niskayuna, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/02 (2006.01); H01L 23/29 (2006.01); H01L 23/31 (2006.01); C23C 16/36 (2006.01); C23C 16/455 (2006.01); C23C 16/50 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02167 (2013.01); C23C 16/36 (2013.01); C23C 16/455 (2013.01); C23C 16/50 (2013.01); H01L 21/02123 (2013.01); H01L 21/02126 (2013.01); H01L 21/02211 (2013.01); H01L 21/02222 (2013.01); H01L 21/02274 (2013.01); H01L 21/02299 (2013.01); H01L 23/291 (2013.01); H01L 23/3171 (2013.01);
Abstract

A method for depositing a dielectric layer that includes introducing a substrate into a process chamber of a deposition tool; and heating the substrate to a process temperature. The method may further include introducing precursors that include at least one dielectric providing gas species for a deposited layer and at least one hydrogen precursor gas into the process chamber of the deposition tool. The hydrogen precursor gas is introduced to the deposition chamber at a flow rate ranging from 50 sccm to 5000 sccm. The molar ratio for Hydrogen/Silicon gas precursor can be equal or greater than 0.05.


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