The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Sep. 30, 2016
Intel Corporation, Santa Clara, CA (US);
Wei Ming Lim, Bayan Lepas, MY;
Madhu Rao, Scottsdale, AZ (US);
Alvin Shing Chye Goh, Bayan Lepas, MY;
Kim Leong Lee, Bayan Lepas, MY;
Terrence Huat Hin Tan, Georgetown, MY;
Vui Yong Liew, Bukit Mertajam, MY;
Yah Chen Chew, sungai petani, MY;
Intel Corporation, Santa Clara, CA (US);
Abstract
Methods and apparatus for predictable protocol aware testing on a memory interface are are shown. An apparatus to support a protocol aware testing on a memory interface may include a digital controller to receive a plurality of read request commands from a unit under test. The digital controller further to hold the plurality of read request commands while a hold signal has a first value, and to sequentially release individual read request commands of the plurality of read request commands while to the hold signal has a second value. The digital controller further to provide input/output (I/O) commands to an output based on a particular released read request command of the plurality of read request commands. Timing of provision of the I/O commands is deterministic based on a transition of the hold signal from the first value to the second value.