The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Jan. 19, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jaewoo Jeong, San Jose, CA (US);

Stuart S. P. Parkin, San Jose, CA (US);

Mahesh G. Samant, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 43/10 (2006.01); H01F 10/16 (2006.01); H01F 41/14 (2006.01); H01L 43/08 (2006.01); H01L 43/12 (2006.01); C22C 22/00 (2006.01); C22C 19/07 (2006.01); C22F 1/10 (2006.01); C22F 1/16 (2006.01); H01F 10/193 (2006.01); H01F 10/30 (2006.01); G11C 11/16 (2006.01); H01F 10/12 (2006.01); H01F 10/32 (2006.01);
U.S. Cl.
CPC ...
H01L 43/10 (2013.01); C22C 19/07 (2013.01); C22C 22/00 (2013.01); C22F 1/10 (2013.01); C22F 1/16 (2013.01); G11C 11/16 (2013.01); H01F 10/16 (2013.01); H01F 10/1936 (2013.01); H01F 10/30 (2013.01); H01F 41/14 (2013.01); H01L 43/08 (2013.01); H01L 43/12 (2013.01); H01F 10/123 (2013.01); H01F 10/3254 (2013.01); H01F 10/3286 (2013.01);
Abstract

Devices are described that include a multi-layered structure that is non-magnetic at room temperature, and which comprises alternating layers of Co and at least one other element E (such as Ga, Ge, and Sn). The composition of this structure is represented by CoE, with x being in the range from 0.45 to 0.55. The structure is in contact with a first magnetic layer that includes a Heusler compound. An MRAM element may be formed by overlying, in turn, the first magnetic layer with a tunnel barrier, and the tunnel barrier with a second magnetic layer (whose magnetic moment is switchable). Improved performance of the MRAM element may be obtained by placing a pinning layer between the first magnetic layer and the tunnel barrier.


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