The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Jan. 09, 2017
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Chun-Wei Hsu, Hsinchu, TW;

Chi-Jen Liu, Taipei, TW;

Cheng-Chun Chang, Taoyuan, TW;

Yi-Sheng Lin, Taichung, TW;

Pinlei Edmund Chu, Hsinchu, TW;

Liang-Guang Chen, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 21/768 (2006.01); H01L 29/66 (2006.01); H01L 21/321 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76823 (2013.01); H01L 21/02074 (2013.01); H01L 21/02244 (2013.01); H01L 21/32125 (2013.01); H01L 21/7684 (2013.01); H01L 21/76805 (2013.01); H01L 21/76814 (2013.01); H01L 21/76888 (2013.01); H01L 21/76895 (2013.01); H01L 29/66795 (2013.01);
Abstract

Methods for forming semiconductor structures are provided. The method for forming a semiconductor structure includes forming a conductive material in the trench and over a top surface of the material layer and polishing the conductive material with a slurry to expose the top surface of the material layer and to form a conductive structure in the trench. The method for forming a semiconductor structure further includes forming a material layer over a substrate and forming a trench in the material layer. The method for forming a semiconductor structure further includes removing the slurry with a reducing solution. In addition, the reducing solution includes a reducing agent, and a standard electrode voltage of the conductive material is greater than a standard electrode voltage of the reducing agent.


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