The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Dec. 21, 2015
Applicant:

Varian Semiconductor Equipment Associates, Inc., Gloucester, MA (US);

Inventors:

Tsung-Liang Chen, Danvers, MA (US);

John Hautala, Beverly, MA (US);

Shurong Liang, Poughkeepsie, NY (US);

Joseph Olson, Beverly, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 14/54 (2006.01); H01L 21/02 (2006.01); C23C 14/22 (2006.01); H01J 37/32 (2006.01); C23C 14/48 (2006.01); C23C 16/04 (2006.01); C23C 16/34 (2006.01); C23C 16/455 (2006.01); C23C 16/52 (2006.01);
U.S. Cl.
CPC ...
C23C 14/54 (2013.01); C23C 14/221 (2013.01); C23C 14/48 (2013.01); C23C 16/045 (2013.01); C23C 16/345 (2013.01); C23C 16/45544 (2013.01); C23C 16/52 (2013.01); H01J 37/32422 (2013.01); H01L 21/0217 (2013.01); H01L 21/02274 (2013.01);
Abstract

Approaches herein increase a ratio of reactive ions to a neutral species in a plasma processing apparatus. Exemplary approaches include providing a processing apparatus having a plasma source chamber including a first gas inlet, and a deposition chamber coupled to the plasma source chamber, wherein the deposition chamber includes a second gas inlet for delivering a point of use (POU) gas to an area proximate a substrate disposed within the deposition chamber. Exemplary approaches further include generating an ion beam for delivery to the substrate, and modifying a pressure within the deposition chamber in the area proximate the substrate to increase an amount of reactive ions present for impacting the substrate when the ion beam is delivered to the substrate.


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