The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Dec. 11, 2015
Applicant:

Floadia Corporation, Kodaira-shi, Tokyo, JP;

Inventors:

Hideo Kasai, Kodaira, JP;

Yasuhiro Taniguchi, Kodaira, JP;

Yutaka Shinagawa, Kodaira, JP;

Ryotaro Sakurai, Kodaira, JP;

Yasuhiko Kawashima, Kodaira, JP;

Kosuke Okuyama, Kodaira, JP;

Assignee:

FLOADIA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01); G11C 16/10 (2006.01); G11C 16/04 (2006.01); H01L 27/115 (2017.01); G11C 16/24 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 5/02 (2006.01); G11C 8/14 (2006.01); H01L 21/8249 (2006.01); H01L 27/11526 (2017.01); H01L 27/11573 (2017.01);
U.S. Cl.
CPC ...
G11C 16/102 (2013.01); G11C 5/025 (2013.01); G11C 8/14 (2013.01); G11C 16/04 (2013.01); G11C 16/0466 (2013.01); G11C 16/10 (2013.01); G11C 16/24 (2013.01); G11C 16/26 (2013.01); G11C 16/3427 (2013.01); G11C 16/3431 (2013.01); H01L 21/8249 (2013.01); H01L 27/115 (2013.01); H01L 27/11526 (2013.01); H01L 27/11573 (2013.01); G11C 2216/02 (2013.01);
Abstract

A non-volatile semiconductor memory device in which, while voltage from a first control line is applied, as a memory gate voltage, to a sub control line through a switching transistor, another switching transistor can block voltage application to a corresponding sub control line. Thus, while a plurality of memory cells are arranged in one direction along the first control line, the number of memory cells to which a memory gate voltage is applied can reduced by the switching transistor, which reduces the occurrence of disturbance, accordingly. The sub control line to which the memory gate voltage is applied from the first control line is used as the gates of memory transistors, and thus the sub control line and the gates are disposed in a single wiring layer, thereby achieving downsizing as compared to a case in which the sub control line and the gates are disposed in separate wiring layers.


Find Patent Forward Citations

Kasai, Hideo. (2018). Non-volatile semiconductor storage device for reducing the number of memory cells arranged along a control to which a memory gate voltage is applied (U.S. Patent No. 10102911). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10102911

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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