The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Mar. 25, 2013
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kazushi Kaneko, Miyagi, JP;

Kazunori Funazaki, Miyagi, JP;

Hideo Kato, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/00 (2006.01); H01J 37/34 (2006.01); C23C 16/511 (2006.01); H03B 9/10 (2006.01); H01J 37/32 (2006.01); H03L 1/00 (2006.01); H03L 5/02 (2006.01); H05H 1/46 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3405 (2013.01); C23C 16/511 (2013.01); H01J 37/32192 (2013.01); H01J 37/32311 (2013.01); H01J 37/32935 (2013.01); H03B 9/10 (2013.01); H03L 1/00 (2013.01); H03L 5/02 (2013.01); H01J 2237/332 (2013.01); H05H 2001/4682 (2013.01);
Abstract

A plasma processing apparatus () is provided with: a processing container (), in which processing is performed using plasma; a plasma generating mechanism (), which has a high frequency oscillator that oscillates high frequency, includes a high frequency generator that generates high frequency by being disposed outside of the processing container (), and which generates plasma in the processing container () using the high frequency generated by means of the high frequency generator; a determining mechanism, which determines the state of the high frequency oscillator; and a notifying mechanism, which performs notification of determination results obtained from the determining mechanism.


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