The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Jan. 03, 2017
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Chirantha Rodrigo, Santa Clara, CA (US);

Jingchun Zhang, Milpitas, CA (US);

Lili Ji, Santa Clara, CA (US);

Anchuan Wang, San Jose, CA (US);

Nitin K. Ingle, San Jose, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/311 (2006.01); C23C 16/44 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32862 (2013.01); C23C 16/4405 (2013.01); H01J 37/3244 (2013.01); H01J 37/32357 (2013.01); H01L 21/31116 (2013.01); H01L 21/31138 (2013.01); H01L 21/67069 (2013.01); H01J 37/32724 (2013.01); H01J 2237/334 (2013.01); Y10S 438/905 (2013.01);
Abstract

The present disclosure provides methods for cleaning chamber components post substrate etching. In one example, a method for cleaning includes activating an etching gas mixture using a plasma to create an activated etching gas mixture, the etching gas mixture comprising hydrogen-containing precursor and a fluorine-containing precursor and delivering the activated etching gas mixture to a processing region of a process chamber, the process chamber having an edge ring positioned therein, the edge ring comprising a catalyst and anticatalytic material, wherein the activated gas removes the anticatalytic material from the edge ring.


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