The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Jun. 12, 2017
Applicant:

Powertech Technology Inc., Hsinchu County, TW;

Inventors:

Han-Wen Lin, Hsinchu County, TW;

Hung-Hsin Hsu, Hsinchu County, TW;

Shang-Yu Chang-Chien, Hsinchu County, TW;

Nan-Chun Lin, Hsinchu County, TW;

Assignee:

POWERTECH TECHNOLOGY INC., Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/48 (2006.01); H01L 25/065 (2006.01); H01L 21/027 (2006.01); H01L 23/485 (2006.01); G03F 7/004 (2006.01);
U.S. Cl.
CPC ...
H01L 25/0652 (2013.01); G03F 7/0041 (2013.01); H01L 21/0273 (2013.01); H01L 23/485 (2013.01);
Abstract

A conductive layer is formed on the first zone of a carrier. The redistribution layer is formed on the conductive layer on the first zone and the second zone of the carrier. Then an open-test and a short-test are performed to the redistribution layer. Since the conductive layer and the parts of the redistribution layer formed on the conductive layer constitute a closed loop, a load is presented if the redistribution layer is formed correctly. In addition, no load is presented if the redistribution layer is formed correctly since the parts of the redistribution layer formed on the second zone of the carrier constitute an open loop. Therefore, whether the redistribution layer is flawed or not is determined before the dies are boned on the redistribution layer. Thus, no waste of the good die is occurred because of the flawed redistribution layer.


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